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Setup for measuring the resistance of thin films using the four-point method in an external magnetic field

Technical description: The Nanometer 1.0 device allows for measuring the resistance and current-voltage characteristics of thin films using the four-point method in the mOhm to MOhm range. It is also possible to measure magnetoresistance by applying a small magnetic field…

Resistivity measurements system Advanced Resistivity System 300, CoreLab Ins.

Contact person: Puskarczyk Edyta
Technical description: Purpose: a set for measuring the electrical resistivity of liquids and solids (cores), measurements at various saturation make it possible to determine the porosity parameter, saturation parameter, sorting constant, compaction factor and saturation …