Equipment
Keithley 4200-SCS Semiconductor Characterization System
Contact person:
Mazur Tomasz
Technical description:
The Keithley Model 4200-SCS is a modular fully integrated parameter analyzer that performs electrical characterization of materials and semiconductor devices and The 4200-SCS software provides a unified measurement interface that guides you through …
Spectroscopic ellipsometer
Contact person:
Mazur Tomasz
Technical description:
The SER-850 spectroscopic ellipsometer is an ultraviolet to near infrared device for measuring the thickness and basic optical properties of thin films and multilayered structures. The device allows both routine and advanced measurements of optical …
