Equipment
Scanning tunnelig microscope control system
Contact person:
Trembułowicz Artur
Technical description:
The "RHK R9plus SPM control system" is part of the Scanning Tunneling Microscope (STM) and is now the latest RHK SPM control electronics recommended for advanced STM measurements. This device has a fully integrated, programmable softwarwe …
Hyperthermia equipment - a device for induction heating of nanoparticle solutions by DACPOL, using an AMBRELL generator
Contact person:
Kmita Angelika
Technical description:
Hyperthermia equipment - a device for induction heating of nanoparticle solutions by DACPOL, using an AMBRELL generator.
The device for induction heating of magnetic nanoparticle solutions consists of:
control system,
component power supply…
HPR-20 R&D quadrupole mass spectrometer (MS)
Contact person:
Kmita Angelika
Technical description:
HPR-20 R&D (MS) quadrupole mass spectrometer coupled with TA Instruments (TG) Q600 thermogravimeter. The TG/DSC-MS system enables qualitative and quantitative analysis of released gases and vapors emitted during sample heating (in the temperatur…
Spectroscopic ellipsometer
Contact person:
Mazur Tomasz
Technical description:
The SER-850 spectroscopic ellipsometer is an ultraviolet to near infrared device for measuring the thickness and basic optical properties of thin films and multilayered structures. The device allows both routine and advanced measurements of optical …