Equipment
CO2 incubator
Contact person:
Wytrwał Magdalena
Technical description:
CO2 dosed incubator for cell culture (Astec, Japan). The incubator is equipped with an air jacket that controls the temperature in the range of at least +5 to 50 ° C, a dust filter, an IR infrared sensor and automatic CO2 calibration. It has a h…
Inverted fluorescence microscope with digital camera
Contact person:
Wytrwał Magdalena
Technical description:
Inverted fluorescence microscope with digital camera (Axio Vert.A1, Carl Zeiss). The modular structure allows the use of many observation techniques, from bright and dark field through phase contrast, Nomarski contrast (DIC), PlasDIC and EPI-fluores…
Freeze-dryer
Contact person:
Wytrwał Magdalena
Technical description:
A freeze dryer (Martin Christ Gefriertrocknungsanlagen GmbH - Germany, Alpha) is used to gently dry products. It is based on the physical phenomenon of sublimation, i.e. direct transition of the solvent from solid to gaseous state. This process elim…
Zetasizer with a titration system and a cell for measuring the zeta potential on a solid
Contact person:
Wytrwał Magdalena
Technical description:
Zetasizer Nano ZS (Malvern Instruments Ltd., Worcestershire, UK) is a device used to characterize such materials as nanoparticles, colloids, proteins, liposomes and microemulsions. The analyzer allows to obtain physicochemical parameters: particle s…
Setup for measuring the resistance of thin films using the four-point method in an external magnetic field
Contact person:
Szkudlarek Aleksandra
Technical description:
The Nanometer 1.0 device allows for measuring the resistance and current-voltage characteristics of thin films using the four-point method in the mOhm to MOhm range. It is also possible to measure magnetoresistance by applying a small magnetic field…
Keithley 4200-SCS Semiconductor Characterization System
Contact person:
Mazur Tomasz
Technical description:
The Keithley Model 4200-SCS is a modular fully integrated parameter analyzer that performs electrical characterization of materials and semiconductor devices and The 4200-SCS software provides a unified measurement interface that guides you through …
Plate reader (Infinite M Nano, Tecan)
Contact person:
Wytrwał Magdalena
Technical description:
Plate reader (Infinite M Nano, Tecan). The device is equipped with two monochromators (xenon UV lamp) for excitation, allowing to perform a full absorbance scan, absorbance reading module in the range of 230-1000 nm with the possibility of selecting…
FTIR spectrometer for measuring infrared spectra
Contact person:
Podborska Agnieszka
Technical description:
The Bruker Tensor II FTIR spectrometer is equipped with:
attachment for measurements of Attenuated Total Reflectance (ATR) with a monolithic diamond crystal enabling measurement in the range of 350-8000 cm-1, adapted to the measurement of…
Vacuum system for thin films sputtering and nanoparticles deposition
Contact person:
Jabłoński Piotr
Technical description:
The deposition system consists of two vacuum chambers made by Mantis, which fulfil the conditions of high vacuum (HV). The first chamber enables the deposition of metal or metal oxide nanoparticles by means of the Inert Gas Condensation (IGC) method…
Magnetron sputtering system Leica EM ACE600
Contact person:
Jabłoński Piotr
Technical description:
High vacuum magnetron sputtering system Lecia EM ACE600 for deposition of thin films from two independent metal target sources. The sputtering system contains:
inner, integrated oil-free diaphragm pump and turbomolecular pump,
two independen…
