Equipment
X-RAY Diffractometer with HT chamber
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
Panalytical Empyrean Powder Diffractometer with Co Lamp It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). They are equipped with…
DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)
Contact person:
Berent Katarzyna
Technical description:
FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …
Universal testing machine Instron 5982
Contact person:
Cios Grzegorz
Technical description:
Maximum load 100 kN. Working area height 1430 mm. Force measurement accuracy +/- 0.5% of reading down to 1/500th of the measuring head range (measuring head series 2580). Data acquisition with a sampling rate of up to 1 kHz simultaneously for force,…
FT-NMT04 in-situ Nanoindenter
Contact person:
Kawałko Jakub
Technical description:
The FT-NMT04 in-situ nanoindenter enables a series of micro-mechanical tests combined with simultaneous observation of the tested sample in a scanning electron microscope (SEM) chamber: Nanoindentation; Micro-pillar compression; Micro-cantilever-bas…
DualBeam Ultra-high-resolution Scanning Electron Microscop with Xenon (Xe) Plasma Focused Ion Beam (PFIB/SEM) with Atomic Force Microscope (AFM)
Contact person:
Berent Katarzyna
Technical description:
Helios 5 is a double-beam ultra-high-resolution scanning electron microscope equipped with a high-stability Schottky Field Emission Gun (FEG) and a Plasma Focused Ion Beam (PFIB). It enables operation with accelerating voltage in the range from 350 …
Rotational rheometer Physica MCR 302 by ANTON PAAR
Contact person:
Kmita Angelika
Technical description:
The Physica MCR 302 rotational rheometer from Anton Paar is a device used to test the rheological properties of various materials. It allows you to perform analyzes (rheological tests) under conditions of constant shear rate (CSS) or constant shear …
Turbomolecular pumped coater Q150T E Quorum Technologies
Contact person:
Berent Katarzyna
Technical description:
The device enables the deposition of high-purity, high-density amorphous carbon (C) thin films on the surface of non-conductive samples to improve the electrical conductivity of samples analyzed using scanning electron microscopy (SEM), transmission…
Pin-on-disk tribometer TRB³ Anton Paar
Contact person:
Gajewska Marta
Technical description:
The device allows you to test tribological properties of a wide range of materials in various modes of: movement (linear, reciprocating), contact (pin, ball), speed and lubrication.
The tribometer is characterized by the following operating param…
Transmission electron microscope (TEM) Tecnai TF 20 X-TWIN (FEI)
Contact person:
Gajewska Marta
Technical description:
Tecnai TF 20 X-TWIN (200 kV) is a high-resolution transmission electron microscope equipped with a Field Emission Gun (FEG). The microscope enables imaging of the microstructure of a wide range of materials (such as: metals and their alloys, ceramic…
Nanoindenter G200 Agilent - KLA
Contact person:
Cios Grzegorz
Technical description:
Testing machine for hardness and Young's modulus on the nanometre scale, with a load range of up to 9.8 N (in high load mode). Equipped with a CSM (Continuous Stiffness Measurement) module for continuous measurement of Young's modulus and ha…
