Equipment
A universal measurement station with an ultra-high-performance X-ray radiation source
Contact person:
Wroński Sebastian
Technical description:
The universal research station is equipped with an X-ray tube based on MetalJet technology. It generates a high-intensity X-ray spectrum containing two characteristic emission lines at energies of 9 keV and 24.2 keV. The system features a dual multi…
Ion polisher and sprayer
Contact person:
Wroński Sebastian
Technical description:
The key factor that determines the quality of the images obtained using SEM electron microscopy is the appropriate preparation of samples. Generally, specimens are prepared by grinding, polishing, and etching. The electron backscattering technique (…
Scanning Electron Microsocpe JEOL JSM-6490LA
Contact person:
Wroński Sebastian
Technical description:
The JEOL JSM-6490LA scanning electron microscope with a LaB6 electron gun and an ion pumping system. The microscope is equipped with both backscattered electron (BSE) and secondary electron (SE) detectors, as well as an EBSD (Electron Back Scattered…
