Equipment
Transmission electron microscope
Contact person:
Kruk Adam
Technical description:
FEI Tecnai G2 20 TWIN is a transmission electron microscope that is an auxiliary device for initial analysis, quality of samples and preliminary structural tests. It is equipped with an electron gun with a LaB6 cathode and allows operation in the ac…
Scanning electron microscope, SEM
Contact person:
Kruk Adam
Technical description:
MERLIN with GEMINI II column and FEG electron source offers high-resolution imaging with advanced detection modes, including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB), 3DSM and STEM. The imaging settings of the Gemini …
High-resolution transmission electron microscope
Contact person:
Kruk Adam
Technical description:
High-resolution analytical transmission electron microscope (resolution equal to 70 pm) with unique instrumentation. It is equipped with an X-FEG electron gun, a monochromator, a corrector for spherical aberration of the condenser system and the lat…
FIB-SEM, SEM Scanning Electron Microscope with FIB Ion gun
Contact person:
Kruk Adam
Technical description:
FIB-SEM Crossbeam 350 with GEMINI column and FEG electron source offers high resolution imaging using advanced detection modes including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB). The imaging settings of the Gemini opt…