Equipment
Hardness tester TUKON 2500
Contact person:
Tokarski Tomasz
Technical description:
The device allows for hardness and microhardness measurements using the Vickers and Knoop methods. The hardness tester is equipped with a motorized table and a digital camera, enabling the automatic execution of single measurements as well as perfor…
Hardness tester TUKON 1202
Contact person:
Tokarski Tomasz
Technical description:
The device enables hardness and microhardness measurements using the Vickers method. The hardness tester is equipped with a manual table with micrometric screw adjustments. The indentation size is measured manually through the microscope eyepiece. T…
Argon ion milling system for samples flat milling or cross-section preparation
Contact person:
Tokarski Tomasz
Technical description:
The ion polisher is a device used for precision polishing of flat surfaces as well as for cross-sectioning metallic, ceramic and polymer materials. The device is capable to work with samples up to 50 mm in diameter at ion energies up to 6 keV. It is…
Wire electrical discharge machine (W-EDM)
Contact person:
Tokarski Tomasz
Technical description:
CNC machine for cutting of conducting materials using wire. it allows for precise cutting of complicated shapes defined by the G-CODE. Cutting is made in deionised water.
Ceramic material resin firing furnace with afterburner
Contact person:
Tokarski Tomasz
Technical description:
The device is used for drying and firing ceramics. The furnace features an automatically closing worktable with a lift, facilitating easier loading of the charge from below. Heating is achieved through resistance using Kanthal thermoelectric element…
ScatterX78
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
The ScatterX78 chamber allows simultaneous measurement in a SAXS and WAXS vacuum. Measurement is possible for object sizes from 1 nm in 1D and 2D dimensions. Additionally, the proposed extension of the research equipment allows for conducting resear…
X-RAY Diffractometer with SAXS/WAXS
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
Panalytical Empyrean powder diffractometers with Cu lamp. It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). Diffractometer equip…
X-RAY Diffractometer with HT chamber
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
Panalytical Empyrean Powder Diffractometer with Co Lamp It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). They are equipped with…
DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)
Contact person:
Berent Katarzyna
Technical description:
FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …
Universal testing machine Instron 5982
Contact person:
Cios Grzegorz
Technical description:
Maximum load 100 kN. Working area height 1430 mm. Force measurement accuracy +/- 0.5% of reading down to 1/500th of the measuring head range (measuring head series 2580). Data acquisition with a sampling rate of up to 1 kHz simultaneously for force,…
