Equipment
Ceramic material resin firing furnace with afterburner
Contact person:
Tokarski Tomasz
Technical description:
The device is used for drying and firing ceramics. The furnace features an automatically closing worktable with a lift, facilitating easier loading of the charge from below. Heating is achieved through resistance using Kanthal thermoelectric element…
ScatterX78
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
The ScatterX78 chamber allows simultaneous measurement in a SAXS and WAXS vacuum. Measurement is possible for object sizes from 1 nm in 1D and 2D dimensions. Additionally, the proposed extension of the research equipment allows for conducting resear…
X-RAY Diffractometer with SAXS/WAXS
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
Panalytical Empyrean powder diffractometers with Cu lamp. It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). Diffractometer equip…
X-RAY Diffractometer with HT chamber
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
Panalytical Empyrean Powder Diffractometer with Co Lamp It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). They are equipped with…
DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)
Contact person:
Berent Katarzyna
Technical description:
FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …
Universal testing machine Instron 5982
Contact person:
Cios Grzegorz
Technical description:
Maximum load 100 kN. Working area height 1430 mm. Force measurement accuracy +/- 0.5% of reading down to 1/500th of the measuring head range (measuring head series 2580). Data acquisition with a sampling rate of up to 1 kHz simultaneously for force,…
FT-NMT04 in-situ Nanoindenter
Contact person:
Kawałko Jakub
Technical description:
The FT-NMT04 in-situ nanoindenter enables a series of micro-mechanical tests combined with simultaneous observation of the tested sample in a scanning electron microscope (SEM) chamber: Nanoindentation; Micro-pillar compression; Micro-cantilever-bas…
DualBeam Ultra-high-resolution Scanning Electron Microscop with Xenon (Xe) Plasma Focused Ion Beam (PFIB/SEM) with Atomic Force Microscope (AFM)
Contact person:
Berent Katarzyna
Technical description:
Helios 5 is a double-beam ultra-high-resolution scanning electron microscope equipped with a high-stability Schottky Field Emission Gun (FEG) and a Plasma Focused Ion Beam (PFIB). It enables operation with accelerating voltage in the range from 350 …
Rotational rheometer Physica MCR 302 by ANTON PAAR
Contact person:
Kmita Angelika
Technical description:
The Physica MCR 302 rotational rheometer from Anton Paar is a device used to test the rheological properties of various materials. It allows you to perform analyzes (rheological tests) under conditions of constant shear rate (CSS) or constant shear …
Turbomolecular pumped coater Q150T E Quorum Technologies
Contact person:
Berent Katarzyna
Technical description:
The device enables the deposition of high-purity, high-density amorphous carbon (C) thin films on the surface of non-conductive samples to improve the electrical conductivity of samples analyzed using scanning electron microscopy (SEM), transmission…
