Equipment
Multifunctional robot for the 500T hydraulic press
Contact person:
Lisiecki Łukasz
Technical description:
1. Industrial robot – Kawasaki RS030N • maximum load capacity: 30 kg • number of axes: 6 • maximum reach: 2100 mm • robot weight (arm): 555 kg • repeatability: ≤ ±0.03mm, (±0.06mm with the surface of t…
Skaner 3D - Gom2
Contact person:
Perzyński Konrad
Technical description:
The GOM Scan 1 non-contact scanner is an advanced device based on GOM's blue light technology and rod projection used in reverse engineering for digitizing analyzed products and objects. GOM Scan 1 is equipped with advanced Blue Light technology…
Transmission electron microscope
Contact person:
Kruk Adam
Technical description:
FEI Tecnai G2 20 TWIN is a transmission electron microscope that is an auxiliary device for initial analysis, quality of samples and preliminary structural tests. It is equipped with an electron gun with a LaB6 cathode and allows operation in the ac…
Scanning electron microscope, SEM
Contact person:
Kruk Adam
Technical description:
MERLIN with GEMINI II column and FEG electron source offers high-resolution imaging with advanced detection modes, including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB), 3DSM and STEM. The imaging settings of the Gemini …
High-resolution transmission electron microscope
Contact person:
Kruk Adam
Technical description:
High-resolution analytical transmission electron microscope (resolution equal to 70 pm) with unique instrumentation. It is equipped with an X-FEG electron gun, a monochromator, a corrector for spherical aberration of the condenser system and the lat…
Frezarka CNC EBERLE FRP 600
Contact person:
Błoniarz Remigiusz
Technical description:
CNC milling machine in gantry configuration, equipped with a tool magazine with a capacity of 8 tools. The 3-axis machine allows the movement of each axis: X=320 mm, Y=250 mm, Z=250 mm. The clamping surface of the table is 500x250 mm. The rotational…
thermobalance, calorimeter
Contact person:
Kargul Tomasz
Technical description:
The device is equipped with a scale with a resolution of 0.1 µg and an air-cooled furnace with rhodium heating elements, allowing for testing in the temperature range from RT to 1550°C, in an inert or oxidizing atmosphere. The furnace'…
FIB-SEM, SEM Scanning Electron Microscope with FIB Ion gun
Contact person:
Kruk Adam
Technical description:
FIB-SEM Crossbeam 350 with GEMINI column and FEG electron source offers high resolution imaging using advanced detection modes including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB). The imaging settings of the Gemini opt…
Optical profilometr
Contact person:
Rozmus-Górnikowska Magdalena
Technical description:
Vertical scanning interferometry mode, phase shift interferometry mode and a mode combining both of the above techniques. - 10mm vertical scan range with closed-loop feedback for the entire scan range. - Camera with a matrix of 640 x 480 pixels and …
Nanohardness Tester NHT 50-183; Nano-Scrach Tester NST 50-146
Contact person:
Radziszewska Agnieszka
Technical description:
Nanohardness Tester: The device is used to measure the hardness of materials with a fine-crystalline structure, thin layers. Performing single and cyclic measurements. Possibility of applying loads from 0.05 mN to 500 mN. Equipped with a Berkovich i…
