Equipment
Furnaces up to 1300°C
Contact person:
Cios Grzegorz
Technical description:
Four resistive furnaces, no inert atmosphere, no vacuum chamber.
EBSD and EDS detectors
Contact person:
Cios Grzegorz
Technical description:
The Symmetry S2 EBSD detector is mounted on a Versa 3D scanning electron microscope (SEM) in the ACMIN scanning electron microscopy laboratory. It allows for: -analysis of the local texture and phase composition of crystalline materials. -with a rat…
Scanning electron microscope equipped with ion gun (SEM/FIB)
Contact person:
Gajewska Marta
Technical description:
The Quanta 3D 200i dual beam (SEM/FIB) microscope is a device dedicated to the preparation of thin films for TEM/STEM research. The instrument is equipped with two guns: electron (tungsten filament) and ion (Ga+), a system of precise dosing of worki…
Low-temperature scanning tunneling microscope
Contact person:
Trembułowicz Artur
Technical description:
The microscope takes advantage of the quantum phenomenon of electron tunneling between the sample and the tip, enabling atomic-resolution observation of sample surfaces. This capability extends to imaging molecular structures, identifying defects, a…
High Performance Computing Cluster TeraACMiN
Contact person:
Biborski Andrzej
Technical description:
Computing cluster consisting of 2 compute nodes each containing two AMD EPYC 9754 processors and equipped with 384 GB of RAM. Total number of logical compute cores is 1024.
Pulsed Laser Deposition System
Contact person:
Naumov Andrii
Technical description:
The PLD system allows the fabrication of epitaxial films, multilayer heterostructures, superlattices, and amorphous layers from various materials (metals, nonmetals, oxides, ceramics, etc.) on a variety of substrates. Our system is equipped with a m…
High-resolution electron beam lithography system
Contact person:
Jurzecka-Szymacha Maria
Technical description:
The Class 100 clean room houses the electron lithography unit (Raith eLine+). The system consists of an electron gun, a secondary electron detector, an in-lens detector, a laser interferometer, control electronics, and a pump system to maintain adeq…
Metallographical microscope (clean room) Nikon Eclipse LV150N
Contact person:
Jurzecka-Szymacha Maria
Technical description:
The light microscope (LM) allows imaging in reflected light in bright field (BF), dark field (DF), polarised light (POL) and reflected light. field (BF). It has a fully motorized stage (X,Y,Z), allowing automatic taking pictures in extended depth of…
Dilution refrigerator with magnet
Contact person:
Chrobak Maciej
Technical description:
The 3He/4He dilution refrigerator operating in a closed cycle allows reaching and stabilizing temperatures in the range from 10 mK to 30 K. Cooling power at 100 mK is 200 μW, and at 20 mK is 4 μW. The integrated superconducting magnet allows t…
Gas sorption analyzer
Contact person:
Jabłoński Piotr
Technical description:
Using the Sieverts volumetric method, the sorption analyzer makes it possible to determine the amount of gas absorbed by a sample under controlled pressure and temperature conditions. It can be used to analyze H2, CO2, CH4, N2, and Ar sorption. The …
