Equipment
DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)
Contact person:
Berent Katarzyna
Technical description:
FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …
Turbomolecular pumped coater Q150T E Quorum Technologies
Contact person:
Berent Katarzyna
Technical description:
The device enables the deposition of high-purity, high-density amorphous carbon (C) thin films on the surface of non-conductive samples to improve the electrical conductivity of samples analyzed using scanning electron microscopy (SEM), transmission…
Transmission electron microscope (TEM) Tecnai TF 20 X-TWIN (FEI)
Contact person:
Gajewska Marta
Technical description:
Tecnai TF 20 X-TWIN (200 kV) is a high-resolution transmission electron microscope equipped with a Field Emission Gun (FEG). The microscope enables imaging of the microstructure of a wide range of materials (such as: metals and their alloys, ceramic…
Scanning electron microscope equipped with ion gun (SEM/FIB)
Contact person:
Gajewska Marta
Technical description:
The Quanta 3D 200i dual beam (SEM/FIB) microscope is a device dedicated to the preparation of thin films for TEM/STEM research. The instrument is equipped with two guns: electron (tungsten filament) and ion (Ga+), a system of precise dosing of worki…
VSM magnetometer with cryostat
Contact person:
Szkudlarek Aleksandra
Technical description:
Vibrating sample magnetometer, LakeShore 7407 VSM, is equipped with continuous flow cryostat and owen. It is capable to probe DC magnetization as a function of temperature and external magnetic field. Temperature dependent measurements can be perfor…
Wavelength dispersive X-ray fluorescence spectrometry (WD-XRF) Rigaku ZSX Primus IV
Contact person:
Mech Krzysztof
Technical description:
The ZSX Primus IV is a wavelength dispersion XRF spectrometer for qualitative, semi-quantitative and quantitative elemental analysis. It is able to detect elements from Be to U.
Specification:
Analyzed elements range: Be – U (Z = 4 &ndas…
Photoelectric spectrometer
Contact person:
Podborska Agnieszka
Technical description:
The measuring system consists of a digitally controlled light source (XBO150 xenon lamp, monochromator, set of edge filters, shutter, light intensity stabilization system), a calibrated photodiode, a dedicated potentiostat and a Kelvin probe with a …
Keithley 4200-SCS Semiconductor Characterization System
Contact person:
Mazur Tomasz
Technical description:
The Keithley Model 4200-SCS is a modular fully integrated parameter analyzer that performs electrical characterization of materials and semiconductor devices and The 4200-SCS software provides a unified measurement interface that guides you through …
FTIR spectrometer for measuring infrared spectra
Contact person:
Podborska Agnieszka
Technical description:
The Bruker Tensor II FTIR spectrometer is equipped with:
attachment for measurements of Attenuated Total Reflectance (ATR) with a monolithic diamond crystal enabling measurement in the range of 350-8000 cm-1, adapted to the measurement of…
Ambient Kelvin Probe
Contact person:
Szaciłowski Konrad
Technical description:
The ambient Kelvin probe is used to measure the work function of conductive materials.
