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X-RAY Diffractometer with HT chamber

Technical description: Panalytical Empyrean Powder Diffractometer with Co Lamp It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). They are equipped with…

DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)

Contact person: Berent Katarzyna
Technical description: FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …

Universal testing machine Instron 5982

Contact person: Cios Grzegorz
Technical description: Maximum load 100 kN. Working area height 1430 mm. Force measurement accuracy +/- 0.5% of reading down to 1/500th of the measuring head range (measuring head series 2580). Data acquisition with a sampling rate of up to 1 kHz simultaneously for force,…

FT-NMT04 in-situ Nanoindenter

Contact person: Kawałko Jakub
Technical description: The FT-NMT04 in-situ nanoindenter enables a series of micro-mechanical tests combined with simultaneous observation of the tested sample in a scanning electron microscope (SEM) chamber: Nanoindentation; Micro-pillar compression; Micro-cantilever-bas…

DualBeam Ultra-high-resolution Scanning Electron Microscop with Xenon (Xe) Plasma Focused Ion Beam (PFIB/SEM) with Atomic Force Microscope (AFM)

Contact person: Berent Katarzyna
Technical description: Helios 5 is a double-beam ultra-high-resolution scanning electron microscope equipped with a high-stability Schottky Field Emission Gun (FEG) and a Plasma Focused Ion Beam (PFIB). It enables operation with accelerating voltage in the range from 350 …

Rotational rheometer Physica MCR 302 by ANTON PAAR

Contact person: Kmita Angelika
Technical description: The Physica MCR 302 rotational rheometer from Anton Paar is a device used to test the rheological properties of various materials. It allows you to perform analyzes (rheological tests) under conditions of constant shear rate (CSS) or constant shear …

Turbomolecular pumped coater Q150T E Quorum Technologies

Contact person: Berent Katarzyna
Technical description: The device enables the deposition of high-purity, high-density amorphous carbon (C) thin films on the surface of non-conductive samples to improve the electrical conductivity of samples analyzed using scanning electron microscopy (SEM), transmission…

High speed mixer

Contact person: Berent Katarzyna
Technical description: The device is used for the rapid mixing and grinding of materials. Suspensions can be homogenously mixed in seconds.

Pin-on-disk tribometer TRB³ Anton Paar

Contact person: Gajewska Marta
Technical description: The device allows you to test tribological properties of a wide range of materials in various modes of: movement (linear, reciprocating), contact (pin, ball), speed and lubrication. The tribometer is characterized by the following operating param…

Transmission electron microscope (TEM) Tecnai TF 20 X-TWIN (FEI)

Contact person: Gajewska Marta
Technical description: Tecnai TF 20 X-TWIN (200 kV) is a high-resolution transmission electron microscope equipped with a Field Emission Gun (FEG). The microscope enables imaging of the microstructure of a wide range of materials (such as: metals and their alloys, ceramic…