Equipment
NOVA NanoSEM 200
Contact person:
Ziąbka Magdalena
Technical description:
Ultra-high resolution scanning electron microscope equipped with field emission electron gun (FEG - Schotky’s emitter), coupled with EDS by EDAX. Threshold resolution 2 nm, magnification range 70 – 500 000x.
Laser Confocal Microscope
Contact person:
Gajek Marcin
Technical description:
The Olympus LEXT OLS4000 is a confocal microscope capable of taking high-resolution 3D images and roughness measurements.
The magnification of this microscope ranges from 108x – 17,280x. The LEXT OLS4000 microscope with software is capable …
Scanning Electron Microscope setup
Contact person:
Ziąbka Magdalena
Technical description:
SEM microscopes with electron (FEG) and ionic columns (Gallium – Scios 2). The SEMs include EDS spectroscopes (EDAX), catodoluminescence (GATAN AMETEK) and time of flight secondary ions mass spectroscope, TOF-SIMS. The microscopes are equipped…
FIB-SEM, SEM Scanning Electron Microscope with FIB Ion gun
Contact person:
Kruk Adam
Technical description:
FIB-SEM Crossbeam 350 with GEMINI column and FEG electron source offers high resolution imaging using advanced detection modes including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB). The imaging settings of the Gemini opt…