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NOVA NanoSEM 200

Contact person: Ziąbka Magdalena
Technical description: Ultra-high resolution scanning electron microscope equipped with field emission  electron gun (FEG - Schotky’s  emitter), coupled with EDS by EDAX. Threshold resolution 2 nm, magnification range 70 – 500 000x.

Laser Confocal Microscope

Contact person: Gajek Marcin
Technical description: The Olympus LEXT OLS4000 is a confocal microscope capable of taking high-resolution 3D images and roughness measurements. The magnification of this microscope ranges from 108x – 17,280x. The LEXT OLS4000 microscope with software is capable …

Scanning Electron Microscope setup

Contact person: Ziąbka Magdalena
Technical description: SEM microscopes with electron (FEG) and ionic columns (Gallium – Scios 2). The SEMs include EDS spectroscopes (EDAX), catodoluminescence (GATAN AMETEK) and time of flight secondary ions mass spectroscope, TOF-SIMS. The microscopes are equipped…

FIB-SEM, SEM Scanning Electron Microscope with FIB Ion gun

Contact person: Kruk Adam
Technical description: FIB-SEM Crossbeam 350 with GEMINI column and FEG electron source offers high resolution imaging using advanced detection modes including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB). The imaging settings of the Gemini opt…