Equipment
Low Energy Inverse Photoemission Spectroscopy (LEIPS)
Contact person:
Marzec Mateusz
Technical description:
The Low Energy Inverse Photoemission Spectrometer (LEIPS) allows determining the electronic structure of unoccupied energy levels of the conduction band of semiconductor materials. Its operating principle is based on the analysis of the spectrum of …
X-ray Photoelectron Spectroscopy
Contact person:
Marzec Mateusz
Technical description:
The spectrometer of photoelectrons emitted under the influence of irradiation with X-ray (XPS) or ultraviolet (UPS) radiation is used to analyze the composition and chemical states of elements on the surface of the tested material. The laboratory is…
Ultrafast spectroscopy system for excited states in the ultraviolet to infrared range
Contact person:
Szaciłowski Konrad
Technical description:
The enVISion™ delivers broadband nanosecond TA spectroscopy that seamlessly probes the UV, visible, and near-infrared spectrum with 5 ns time resolution and up to milliseconds of delay time. Record the entire time axis with a single laser…
Hyperthermia equipment - a device for induction heating of nanoparticle solutions by DACPOL, using an AMBRELL generator
Contact person:
Kmita Angelika
Technical description:
Hyperthermia equipment - a device for induction heating of nanoparticle solutions by DACPOL, using an AMBRELL generator.
The device for induction heating of magnetic nanoparticle solutions consists of:
control system,
component power supply…
HPR-20 R&D quadrupole mass spectrometer (MS)
Contact person:
Kmita Angelika
Technical description:
HPR-20 R&D (MS) quadrupole mass spectrometer coupled with TA Instruments (TG) Q600 thermogravimeter. The TG/DSC-MS system enables qualitative and quantitative analysis of released gases and vapors emitted during sample heating (in the temperatur…
Spectroscopic ellipsometer
Contact person:
Mazur Tomasz
Technical description:
The SER-850 spectroscopic ellipsometer is an ultraviolet to near infrared device for measuring the thickness and basic optical properties of thin films and multilayered structures. The device allows both routine and advanced measurements of optical …
Universal fatigue testing machine MTS 810
Contact person:
Machniewicz Tomasz
Technical description:
A two-column universal servohydraulic testing machine capable of conducting single-axis static and fatigue tests under the control of force, displacement, or any analogue sensor used during testing (e.g., strain gauge, extensometer, etc.).
Exempl…
Apparatus for sorption measurements NOVA 800 Anton Paar
Contact person:
Bajda Tomasz
Technical description:
NOVA 800 Anton Paar is an analyzer for measuring gas sorption and determining BET surface area, size, volume, and pore distribution in powders and porous materials.
Apparatus characteristics:
apparatus compatible with N2, He and CO2 gases
…
Ocean Insight modular optical spectrometer kit
Contact person:
Matuszak Zenon
Technical description:
The kit includes several compact fiber optic spectrometers that can be configured for the measurements to be made. The kit includes spectrometers: QE-Raman, Flame-VIS-NIR, Flame-NIR, Ocean-HDX-XR, Flame-S-VIS-NIR, NIR-Quest with all necessary access…
The mechanical surface properties testing platform Anton Paar Step 500
Contact person:
Drenda Cezary
Technical description:
The mechanical surface properties testing platform from Anton Paar company model Step 500 is equipped with:
NHT3 tester (nano hardness tester);
MCT3 tester (micro combi tester);
optical head providing magnification of 5,20,50,100 times;
…
