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Photoelectric spectrometer

Contact person: Podborska Agnieszka
Technical description: The measuring system consists of a digitally controlled light source (XBO150 xenon lamp, monochromator, set of edge filters, shutter, light intensity stabilization system), a calibrated photodiode, a dedicated potentiostat and a Kelvin probe with a …

Wavelength dispersive X-ray fluorescence spectrometry (WD-XRF) Rigaku ZSX Primus IV

Contact person: Mech Krzysztof
Technical description: The ZSX Primus IV is a wavelength dispersion XRF spectrometer for qualitative, semi-quantitative and quantitative elemental analysis. It is able to detect elements from Be to U. Specification: Analyzed elements range: Be – U (Z = 4 &ndas…

Transmission electron microscope

Contact person: Kruk Adam
Technical description: FEI Tecnai G2 20 TWIN is a transmission electron microscope that is an auxiliary device for initial analysis, quality of samples and preliminary structural tests. It is equipped with an electron gun with a LaB6 cathode and allows operation in the ac…

Scanning electron microscope, SEM

Contact person: Kruk Adam
Technical description: MERLIN with GEMINI II column and FEG electron source offers high-resolution imaging with advanced detection modes, including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB), 3DSM and STEM. The imaging settings of the Gemini …

Scanning electron microscope equipped with ion gun (SEM/FIB)

Contact person: Gajewska Marta
Technical description: The Quanta 3D 200i dual beam (SEM/FIB) microscope is a device dedicated to the preparation of thin films for TEM/STEM research. The instrument is equipped with two guns: electron (tungsten filament) and ion (Ga+), a system of precise dosing of worki…

High-resolution transmission electron microscope

Contact person: Kruk Adam
Technical description: High-resolution analytical transmission electron microscope (resolution equal to 70 pm) with unique instrumentation. It is equipped with an X-FEG electron gun, a monochromator, a corrector for spherical aberration of the condenser system and the lat…

Selective laser sintering 3D printer

Contact person: Dudek Piotr
Technical description: 3D printer for manufacturing parts by selective sintering plastic powder by CO2 laser in protective nitrogen atmosfere

Scanning Laser Doppler Vibrometer (SLDV)

Contact person: Pieczonka Łukasz
Technical description: Universal measurement system allowing the analysis and visualization of structural vibrations in high frequency band (from 0 to 25 MHz) and very high precision (<1𝑝𝑚/√𝐻𝑧 or <0.1 μm/s/√𝐻𝑧).  The use of near infrared las…

Spectroscopic ellipsometer

Contact person: Mazur Tomasz
Technical description: The SER-850 spectroscopic ellipsometer is an ultraviolet to near infrared device for measuring the thickness and basic optical properties of thin films and multilayered structures. The device allows both routine and advanced measurements of optical …


Contact person: Styszko Katarzyna
Technical description: The TSQ Altis mass spectrometer is a next-generation triple quadrupole mass spectrometer designed to provide ultimate confidence in results. The TSQ Altis MS is built on a foundation of state-of-the-art hardware and software components providing sup…